High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity

J.F.M. van Rens; W. Verhoeven; E.R. Kieft; J.G.H. Franssen; P.H.A. Mutsaers; O.J. Luiten

High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity

J.F.M. van Rens, W. Verhoeven, E.R. Kieft, J.G.H. Franssen, P.H.A. Mutsaers, O.J. Luiten

Coherence and Quantum Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

In collaboration with FEI Company, we are studying the possi- bility of using microwave TM110 streak cavities in combination with a slit, to chop a continuous electron beam into 100 fs elec- tron bunches.We have shown that this can be done with minimal increase in transverse emittance and longitudinal energy spread. Furthermore, these bunches are created at a repetition rate of 3 GHz. Accurately synchronized to a mode-locked laser system, this allows for high-frequency pump-probe experiments with the beam quality of high-end electron microscopes. At Eindhoven University of Technology, we will soon implement such a cavity in a 200 keV Tecnai, which should result in high- frequency ultrafast (S)TEM with sub-ps time-resolution while maintaining the atomic spatial resolution of the TEM.

Original language	English
Title of host publication	Femtosecond Electron Imaging and Spectroscopy (FEIS-2)
Subtitle of host publication	Book of Abstracts
Place of Publication	East Lansing, Michigan
Publisher	Michigan State University
Publication status	Published - 2015
Event	Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA - Lansing, MI, United States Duration: 6 May 2015 → 9 May 2015 http://www.feis-2.org/

Conference

Conference	Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA
Abbreviated title	FEIS-2
Country/Territory	United States
City	Lansing, MI
Period	6/05/15 → 9/05/15
Other	Femtosecond Electron Imaging and Microscopy-2 (FEIS-2) in Lansing, Michigan, USA,
Internet address	http://www.feis-2.org/

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title = "High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity",

abstract = "In collaboration with FEI Company, we are studying the possi- bility of using microwave TM110 streak cavities in combination with a slit, to chop a continuous electron beam into 100 fs elec- tron bunches.We have shown that this can be done with minimal increase in transverse emittance and longitudinal energy spread. Furthermore, these bunches are created at a repetition rate of 3 GHz. Accurately synchronized to a mode-locked laser system, this allows for high-frequency pump-probe experiments with the beam quality of high-end electron microscopes. At Eindhoven University of Technology, we will soon implement such a cavity in a 200 keV Tecnai, which should result in high- frequency ultrafast (S)TEM with sub-ps time-resolution while maintaining the atomic spatial resolution of the TEM.",

author = "\{van Rens\}, J.F.M. and W. Verhoeven and E.R. Kieft and J.G.H. Franssen and P.H.A. Mutsaers and O.J. Luiten",

year = "2015",

language = "English",

booktitle = "Femtosecond Electron Imaging and Spectroscopy (FEIS-2)",

publisher = "Michigan State University",

note = "Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA, FEIS-2 ; Conference date: 06-05-2015 Through 09-05-2015",

url = "http://www.feis-2.org/",

}

van Rens, JFM, Verhoeven, W, Kieft, ER, Franssen, JGH , Mutsaers, PHA & Luiten, OJ 2015, High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity. in Femtosecond Electron Imaging and Spectroscopy (FEIS-2) : Book of Abstracts. Michigan State University, East Lansing, Michigan, Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA, Lansing, MI, United States, 6/05/15.

High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity. / van Rens, J.F.M.; Verhoeven, W.; Kieft, E.R. et al.
Femtosecond Electron Imaging and Spectroscopy (FEIS-2) : Book of Abstracts. East Lansing, Michigan: Michigan State University, 2015.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity

AU - van Rens, J.F.M.

AU - Verhoeven, W.

AU - Kieft, E.R.

AU - Franssen, J.G.H.

AU - Mutsaers, P.H.A.

AU - Luiten, O.J.

PY - 2015

Y1 - 2015

N2 - In collaboration with FEI Company, we are studying the possi- bility of using microwave TM110 streak cavities in combination with a slit, to chop a continuous electron beam into 100 fs elec- tron bunches.We have shown that this can be done with minimal increase in transverse emittance and longitudinal energy spread. Furthermore, these bunches are created at a repetition rate of 3 GHz. Accurately synchronized to a mode-locked laser system, this allows for high-frequency pump-probe experiments with the beam quality of high-end electron microscopes. At Eindhoven University of Technology, we will soon implement such a cavity in a 200 keV Tecnai, which should result in high- frequency ultrafast (S)TEM with sub-ps time-resolution while maintaining the atomic spatial resolution of the TEM.

AB - In collaboration with FEI Company, we are studying the possi- bility of using microwave TM110 streak cavities in combination with a slit, to chop a continuous electron beam into 100 fs elec- tron bunches.We have shown that this can be done with minimal increase in transverse emittance and longitudinal energy spread. Furthermore, these bunches are created at a repetition rate of 3 GHz. Accurately synchronized to a mode-locked laser system, this allows for high-frequency pump-probe experiments with the beam quality of high-end electron microscopes. At Eindhoven University of Technology, we will soon implement such a cavity in a 200 keV Tecnai, which should result in high- frequency ultrafast (S)TEM with sub-ps time-resolution while maintaining the atomic spatial resolution of the TEM.

M3 - Conference contribution

BT - Femtosecond Electron Imaging and Spectroscopy (FEIS-2)

PB - Michigan State University

CY - East Lansing, Michigan

T2 - Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA

Y2 - 6 May 2015 through 9 May 2015

ER -

High-quality, high-repetition rate, ultrashort electron bunches generated with an RF-cavity

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