Abstract
In collaboration with FEI Company, we are studying the possi-
bility of using microwave TM110 streak cavities in combination
with a slit, to chop a continuous electron beam into 100 fs elec-
tron bunches.We have shown that this can be done with minimal
increase in transverse emittance and longitudinal energy spread.
Furthermore, these bunches are created at a repetition rate of 3
GHz. Accurately synchronized to a mode-locked laser system,
this allows for high-frequency pump-probe experiments with the
beam quality of high-end electron microscopes.
At Eindhoven University of Technology, we will soon implement
such a cavity in a 200 keV Tecnai, which should result in high-
frequency ultrafast (S)TEM with sub-ps time-resolution while
maintaining the atomic spatial resolution of the TEM.
| Original language | English |
|---|---|
| Title of host publication | Femtosecond Electron Imaging and Spectroscopy (FEIS-2) |
| Subtitle of host publication | Book of Abstracts |
| Place of Publication | East Lansing, Michigan |
| Publisher | Michigan State University |
| Publication status | Published - 2015 |
| Event | Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA - Lansing, MI, United States Duration: 6 May 2015 → 9 May 2015 http://www.feis-2.org/ |
Conference
| Conference | Femtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA |
|---|---|
| Abbreviated title | FEIS-2 |
| Country/Territory | United States |
| City | Lansing, MI |
| Period | 6/05/15 → 9/05/15 |
| Other | Femtosecond Electron Imaging and Microscopy-2 (FEIS-2) in Lansing, Michigan, USA, |
| Internet address |