High pretilt four-domain twisted nematic liquid crystal display by microrubbing : process, characterization and optical simulation

S. Varghese, G.P. Crawford, C.W.M. Bastiaansen, D.K.G. Boer, de, D.J. Broer

    Research output: Contribution to journalArticleAcademicpeer-review

    13 Citations (Scopus)
    145 Downloads (Pure)

    Abstract

    A microrubbing (µ-rubbing) technique was utilized to create four-domain alignment in a liquid crystal display sample. A small metallic sphere under sufficient load was used to directly rub a homeotropic polyimide alignment layer to create a large surface pretilt angle. We demonstrate a 47-µm linewidth and a variable pretilt angle with respect to the substrate plane for different loads. The homeotropic polyimide surface was µ rubbed in such a way that neighboring alignment regions are rubbed in opposite directions. liquid crystal cells were constructed with two µ-rubbed substrates where the rubbing directions are orthogonal to each other. With this cell configuration we obtained four domains consisting of two left-handed and two right-handed twisted nematic subpixels. We report on the electro-optic performance properties, viewing angle characteristics, the relationship between pretilt angle versus load, and thermal aging study of the four-domain liquid crystal cell. The optical simulations of the liquid crystal director orientation, viewing angle characteristics, and the contrast ratio of the four domains are also presented. The experimental results are in agreement with the simulation results. ©2005 American Institute of Physics
    Original languageEnglish
    Article number53101
    Pages (from-to)53101-1/8
    Number of pages8
    JournalJournal of Applied Physics
    Volume97
    Issue number5
    DOIs
    Publication statusPublished - 2005

    Fingerprint

    Dive into the research topics of 'High pretilt four-domain twisted nematic liquid crystal display by microrubbing : process, characterization and optical simulation'. Together they form a unique fingerprint.

    Cite this