High precision material characterization method using THz spectroscopy

J. L.M. Van Mechelen, A. B. Kuzmenko, H. Merbold

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

We propose a novel THz material analysis approach which consists of a combination of a stratified dispersive model, an appropriate measurement configuration and a time-domain based fitting procedure. The measurement configuration is modeled as a stratified system where for each layer the light-matter interaction is realistically described. The method is illustrated for the industrial quality control of (coated) paper sheets and is shown to give highly accurate results in humid air and irrespective of the position of the reference mirror in reflection.

Original languageEnglish
Title of host publication2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014
PublisherIEEE Computer Society
ISBN (Electronic)9781479938773
DOIs
Publication statusPublished - 13 Nov 2014
Externally publishedYes
Event39th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz 2014) - Tucson, United States
Duration: 14 Sep 201419 Sep 2014
Conference number: 39

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference39th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz 2014)
Abbreviated titleIRWWM-THz 2014
CountryUnited States
CityTucson
Period14/09/1419/09/14

Fingerprint

Dive into the research topics of 'High precision material characterization method using THz spectroscopy'. Together they form a unique fingerprint.

Cite this