High energy ion scattering and recoil spectrometry in applied materials science

L.J. van IJzendoorn

doi:10.1016/0003-2670(94)00055-7

High energy ion scattering and recoil spectrometry in applied materials science

L.J. van IJzendoorn

Department of Applied Physics

Research output: Contribution to journal › Review article › Academic › peer-review

10 Citations (Scopus)

Abstract

The fundamentals of high energy ion scattering and recoil spectrometry (possibly combined with channelling) are discussed in relation to the accuracies required for materials science studies and in relation to characteristics of competing surface analysis techniques. The extreme versatility of ion scattering techniques is demonstrated by a survey through many application areas in materials science ranging from plastics to oxidic insulators, semiconductors and metals.

Original language	English
Pages (from-to)	55-72
Number of pages	18
Journal	Analytica Chimica Acta
Volume	297
Issue number	1-2
DOIs	https://doi.org/10.1016/0003-2670(94)00055-7
Publication status	Published - 1 Jan 1994

Keywords

High energy ion scattering
Materials science
Recoil spectrometry
Surface techniques

Access to Document

10.1016/0003-2670(94)00055-7

Link to publication in Scopus

Fingerprint Dive into the research topics of 'High energy ion scattering and recoil spectrometry in applied materials science'. Together they form a unique fingerprint.

Cite this

van IJzendoorn, L. J. (1994). High energy ion scattering and recoil spectrometry in applied materials science. Analytica Chimica Acta, 297(1-2), 55-72. https://doi.org/10.1016/0003-2670(94)00055-7

@article{6466d83596914663bf5abb9ff4c13268,

title = "High energy ion scattering and recoil spectrometry in applied materials science",

abstract = "The fundamentals of high energy ion scattering and recoil spectrometry (possibly combined with channelling) are discussed in relation to the accuracies required for materials science studies and in relation to characteristics of competing surface analysis techniques. The extreme versatility of ion scattering techniques is demonstrated by a survey through many application areas in materials science ranging from plastics to oxidic insulators, semiconductors and metals.",

keywords = "High energy ion scattering, Materials science, Recoil spectrometry, Surface techniques",

author = "{van IJzendoorn}, L.J.",

year = "1994",

month = jan,

day = "1",

doi = "10.1016/0003-2670(94)00055-7",

language = "English",

volume = "297",

pages = "55--72",

journal = "Analytica Chimica Acta",

issn = "0003-2670",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - High energy ion scattering and recoil spectrometry in applied materials science

AU - van IJzendoorn, L.J.

PY - 1994/1/1

Y1 - 1994/1/1

N2 - The fundamentals of high energy ion scattering and recoil spectrometry (possibly combined with channelling) are discussed in relation to the accuracies required for materials science studies and in relation to characteristics of competing surface analysis techniques. The extreme versatility of ion scattering techniques is demonstrated by a survey through many application areas in materials science ranging from plastics to oxidic insulators, semiconductors and metals.

AB - The fundamentals of high energy ion scattering and recoil spectrometry (possibly combined with channelling) are discussed in relation to the accuracies required for materials science studies and in relation to characteristics of competing surface analysis techniques. The extreme versatility of ion scattering techniques is demonstrated by a survey through many application areas in materials science ranging from plastics to oxidic insulators, semiconductors and metals.

KW - High energy ion scattering

KW - Materials science

KW - Recoil spectrometry

KW - Surface techniques

UR - http://www.scopus.com/inward/record.url?scp=0027987916&partnerID=8YFLogxK

U2 - 10.1016/0003-2670(94)00055-7

DO - 10.1016/0003-2670(94)00055-7

M3 - Review article

AN - SCOPUS:0027987916

VL - 297

SP - 55

EP - 72

JO - Analytica Chimica Acta

JF - Analytica Chimica Acta

SN - 0003-2670

IS - 1-2

ER -