Guided interaction exploration in artifact-centric process models

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Abstract

Artifact-centric process models aim to describe complex processes as a collection of interacting artifacts. Recent development in process mining allow for the discovery of such models. However, the focus is often on the representation of the individual artifacts rather than their interactions. Based on event data we can automatically discover composite state machines representing artifact-centric processes. Moreover, we provide ways of visualizing and quantifying interactions among different artifacts. For example, we are able to highlight strongly correlated behaviours in different artifacts. The approach has been fully implemented as a ProM plug-in; the CSM Miner provides an interactive artifact-centric process discovery tool focussing on interactions. The approach has been evaluated using real life data sets, including the personal loan and overdraft process of a Dutch financial institution.

Original languageEnglish
Title of host publication2017 IEEE 19th Conference on Business Informatics (CBI), Business Informatics (CBI), 24-27 July 2017, Thessaloniki, Greece
PublisherInstitute of Electrical and Electronics Engineers
Pages109-118
Number of pages10
ISBN (Electronic)978-1-5386-3036-5
ISBN (Print)978-1-5386-3036-5
DOIs
Publication statusPublished - 14 Aug 2017
Event19th IEEE Conference on Business Informatics( CBI 2017), 24-26 July 2017, Thessaloniki, Greece - Tessaloniki, Greece
Duration: 24 Jul 201726 Jul 2017

Conference

Conference19th IEEE Conference on Business Informatics( CBI 2017), 24-26 July 2017, Thessaloniki, Greece
Abbreviated titleCBI2017
CountryGreece
CityTessaloniki
Period24/07/1726/07/17

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Keywords

  • Artifact-centric Processes
  • Measures of Interestingness
  • Process mining

Cite this

van Eck, M. L., Sidorova, N., & van der Aalst, W. M. P. (2017). Guided interaction exploration in artifact-centric process models. In 2017 IEEE 19th Conference on Business Informatics (CBI), Business Informatics (CBI), 24-27 July 2017, Thessaloniki, Greece (pp. 109-118). [8010712] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CBI.2017.42