Guided interaction exploration in artifact-centric process models

M.L. van Eck; N. Sidorova; W.M.P. van der Aalst

doi:10.1109/CBI.2017.42

Guided interaction exploration in artifact-centric process models

M.L. van Eck, N. Sidorova, W.M.P. van der Aalst

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

15 Citations (Scopus)

131 Downloads (Pure)

Abstract

Artifact-centric process models aim to describe complex processes as a collection of interacting artifacts. Recent development in process mining allow for the discovery of such models. However, the focus is often on the representation of the individual artifacts rather than their interactions. Based on event data we can automatically discover composite state machines representing artifact-centric processes. Moreover, we provide ways of visualizing and quantifying interactions among different artifacts. For example, we are able to highlight strongly correlated behaviours in different artifacts. The approach has been fully implemented as a ProM plug-in; the CSM Miner provides an interactive artifact-centric process discovery tool focussing on interactions. The approach has been evaluated using real life data sets, including the personal loan and overdraft process of a Dutch financial institution.

Original language	English
Title of host publication	2017 IEEE 19th Conference on Business Informatics (CBI), Business Informatics (CBI), 24-27 July 2017, Thessaloniki, Greece
Publisher	Institute of Electrical and Electronics Engineers
Pages	109-118
Number of pages	10
ISBN (Electronic)	978-1-5386-3036-5
ISBN (Print)	978-1-5386-3036-5
DOIs	https://doi.org/10.1109/CBI.2017.42
Publication status	Published - 14 Aug 2017
Event	19th IEEE Conference on Business Informatics, CBI 2017 - Tessaloniki, Greece Duration: 24 Jul 2017 → 26 Jul 2017 Conference number: 19

Conference

Conference	19th IEEE Conference on Business Informatics, CBI 2017
Abbreviated title	CBI 2017
Country/Territory	Greece
City	Tessaloniki
Period	24/07/17 → 26/07/17

Keywords

Artifact-centric Processes
Measures of Interestingness
Process mining

Access to Document

10.1109/CBI.2017.42

GuidedInteractionExplorationInArtifact-centricProcessModelsFinal author version , 1.66 MB

Cite this

van Eck, M. L., Sidorova, N., & van der Aalst, W. M. P. (2017). Guided interaction exploration in artifact-centric process models. In 2017 IEEE 19th Conference on Business Informatics (CBI), Business Informatics (CBI), 24-27 July 2017, Thessaloniki, Greece (pp. 109-118). Article 8010712 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CBI.2017.42

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abstract = "Artifact-centric process models aim to describe complex processes as a collection of interacting artifacts. Recent development in process mining allow for the discovery of such models. However, the focus is often on the representation of the individual artifacts rather than their interactions. Based on event data we can automatically discover composite state machines representing artifact-centric processes. Moreover, we provide ways of visualizing and quantifying interactions among different artifacts. For example, we are able to highlight strongly correlated behaviours in different artifacts. The approach has been fully implemented as a ProM plug-in; the CSM Miner provides an interactive artifact-centric process discovery tool focussing on interactions. The approach has been evaluated using real life data sets, including the personal loan and overdraft process of a Dutch financial institution.",

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publisher = "Institute of Electrical and Electronics Engineers",

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note = "19th IEEE Conference on Business Informatics, CBI 2017, CBI 2017 ; Conference date: 24-07-2017 Through 26-07-2017",

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van Eck, ML, Sidorova, N & van der Aalst, WMP 2017, Guided interaction exploration in artifact-centric process models. in 2017 IEEE 19th Conference on Business Informatics (CBI), Business Informatics (CBI), 24-27 July 2017, Thessaloniki, Greece., 8010712, Institute of Electrical and Electronics Engineers, pp. 109-118, 19th IEEE Conference on Business Informatics, CBI 2017, Tessaloniki, Greece, 24/07/17. https://doi.org/10.1109/CBI.2017.42

Guided interaction exploration in artifact-centric process models. / van Eck, M.L.; Sidorova, N.; van der Aalst, W.M.P.
2017 IEEE 19th Conference on Business Informatics (CBI), Business Informatics (CBI), 24-27 July 2017, Thessaloniki, Greece. Institute of Electrical and Electronics Engineers, 2017. p. 109-118 8010712.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Guided interaction exploration in artifact-centric process models

Abstract

Conference

Keywords

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Impuls I - Health - Perinatal Monitoring - TU/e funded

Perinatal Medicine

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Guided interaction exploration in artifact-centric process models

Abstract

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Projects

Impuls I - Health - Perinatal Monitoring - TU/e funded

Research areas

Perinatal Medicine

Cite this