Abstract
In this work, the integrated diffusion coefficient, D'-int' is
used to describe the growth kinetics of silicides in Ni -Si
and Ni-SiC diffusion couples. The integrated diffusion
coefficients are determined from planar diffusion couple
experiments for all intermetallic phases of the binary Ni-Si
system between 1073 and 1173 K. For the growth of NisSi2
'an activation energy of 180 ± 30 kJjmol (1.9 ± 0.3 eV) was
found. The position of the Kirkendall plane revealed that
Ni is the only diffusing species in Ni3 Si and NisSi2. In
NiSi2, Ni and Si are equally mobile. The activation energy
for the interdiffusion in the Ni(Si) solid solution, measured
between 1093 and 1423 K, is 250 ± 10 kJjmol (2.6 ± 0.1 eV)
and is independent of the Si-concentration.
| Original language | English |
|---|---|
| Pages (from-to) | 530-539 |
| Number of pages | 10 |
| Journal | Zeitschrift fuer Metallkunde |
| Volume | 86 |
| Issue number | 8 |
| Publication status | Published - 1995 |
Fingerprint
Dive into the research topics of 'Growth of silicides in Ni-Si and Ni-SiC bulk diffusion couples'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver