Grade change control using INCA model predictive controller: application on a Dow Polystyrene process model

W. Van Brempt, P. Overschee, van, A.C.P.M. Backx, J.H.A. Ludlage, P. Hayot, L. Oostvogels, S. Rahman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 2003 American Control Conference
Place of Publication	Denver, Colorado, USA
Publication status	Published - 2004
Event	2003 American Control Conference (ACC 2003), June 4-6, 2003, Denver, CO, USA - Adams Mark Hotel, Denver, CO, United States Duration: 4 Jun 2004 → 6 Jun 2004

Conference	2003 American Control Conference (ACC 2003), June 4-6, 2003, Denver, CO, USA
Abbreviated title	ACC 2003
Country/Territory	United States
City	Denver, CO
Period	4/06/04 → 6/06/04

Cite this

@inproceedings{e7837bae0a464fd193b7b7f8993174b0,

title = "Grade change control using INCA model predictive controller: application on a Dow Polystyrene process model",

author = "{Van Brempt}, W. and {Overschee, van}, P. and A.C.P.M. Backx and J.H.A. Ludlage and P. Hayot and L. Oostvogels and S. Rahman",

year = "2004",

language = "English",

booktitle = "Proc. 2003 American Control Conference",

note = "2003 American Control Conference (ACC 2003), June 4-6, 2003, Denver, CO, USA, ACC 2003 ; Conference date: 04-06-2004 Through 06-06-2004",

}

Van Brempt, W, Overschee, van, P, Backx, ACPM, Ludlage, JHA, Hayot, P, Oostvogels, L & Rahman, S 2004, Grade change control using INCA model predictive controller: application on a Dow Polystyrene process model. in Proc. 2003 American Control Conference. Denver, Colorado, USA, 2003 American Control Conference (ACC 2003), June 4-6, 2003, Denver, CO, USA, Denver, CO, United States, 4/06/04.

TY - GEN

T1 - Grade change control using INCA model predictive controller: application on a Dow Polystyrene process model

AU - Van Brempt, W.

AU - Overschee, van, P.

AU - Backx, A.C.P.M.

AU - Ludlage, J.H.A.

AU - Hayot, P.

AU - Oostvogels, L.

AU - Rahman, S.

PY - 2004

Y1 - 2004

M3 - Conference contribution

BT - Proc. 2003 American Control Conference

CY - Denver, Colorado, USA

T2 - 2003 American Control Conference (ACC 2003), June 4-6, 2003, Denver, CO, USA

Y2 - 4 June 2004 through 6 June 2004

ER -