Abstract
A novel general ready-to-use bit-error rate (BER) expression for one-dimensional constellations is developed. The BER analysis is performed for bit patterns that form a labeling. The number of patterns for equally spaced M-PAM constellations with different BER is analyzed.
| Original language | English |
|---|---|
| Title of host publication | IEEE Global Communications Conference (GLOBECOM) 2012 |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 2162-2167 |
| ISBN (Electronic) | 978-1-4673-0921-9 |
| ISBN (Print) | 978-1-4673-0920-2 |
| DOIs | |
| Publication status | Published - Dec 2012 |
| Event | 2012 IEEE Global Communications Conference (GLOBECOM 2012) - Anaheim, United States Duration: 3 Dec 2012 → 7 Dec 2012 |
Conference
| Conference | 2012 IEEE Global Communications Conference (GLOBECOM 2012) |
|---|---|
| Abbreviated title | GLOBECOM 2012 |
| Country/Territory | United States |
| City | Anaheim |
| Period | 3/12/12 → 7/12/12 |