General BER expression for one-dimensional constellations

M. Ivanov, F.N. Brannstrom, A. Alvarado, E. Agrell

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Abstract

A novel general ready-to-use bit-error rate (BER) expression for one-dimensional constellations is developed. The BER analysis is performed for bit patterns that form a labeling. The number of patterns for equally spaced M-PAM constellations with different BER is analyzed.
Original languageEnglish
Title of host publicationIEEE Global Communications Conference (GLOBECOM) 2012
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages2162-2167
ISBN (Electronic)978-1-4673-0921-9
ISBN (Print)978-1-4673-0920-2
DOIs
Publication statusPublished - Dec 2012
Event2012 IEEE Global Communications Conference (GLOBECOM 2012) - Anaheim, CA, USA, Anaheim, CA, United States
Duration: 3 Dec 20127 Dec 2012

Conference

Conference2012 IEEE Global Communications Conference (GLOBECOM 2012)
Abbreviated titleGLOBECOM 2012
CountryUnited States
CityAnaheim, CA
Period3/12/127/12/12

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