Gate sizing using a statistical delay model

E.T.A.F. Jacobs, M.R.C.M. Berkelaar

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	DATE 2000, Paris, France
Pages	283-290
Publication status	Published - 2000
Event	3rd Design, Automation and Test in Europe Conference (DATE 2000) - Paris, France Duration: 28 Mar 2000 → 30 Mar 2000 Conference number: 3

Conference	3rd Design, Automation and Test in Europe Conference (DATE 2000)
Abbreviated title	DATE 2000
Country/Territory	France
City	Paris
Period	28/03/00 → 30/03/00

Cite this

@inproceedings{f69ecb624e24496f976e3760278ea008,

title = "Gate sizing using a statistical delay model",

author = "E.T.A.F. Jacobs and M.R.C.M. Berkelaar",

year = "2000",

language = "English",

pages = "283--290",

booktitle = "DATE 2000, Paris, France",

note = "3rd Design, Automation and Test in Europe Conference (DATE 2000), DATE 2000 ; Conference date: 28-03-2000 Through 30-03-2000",

}