Gate sizing using a statistical delay model

E.T.A.F. Jacobs, M.R.C.M. Berkelaar

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

73 Citations (Scopus)
Original languageEnglish
Title of host publicationDATE 2000, Paris, France
Pages283-290
Publication statusPublished - 2000
Event3rd Design, Automation and Test in Europe Conference (DATE 2000) - Paris, France
Duration: 28 Mar 200030 Mar 2000
Conference number: 3

Conference

Conference3rd Design, Automation and Test in Europe Conference (DATE 2000)
Abbreviated titleDATE 2000
Country/TerritoryFrance
CityParis
Period28/03/0030/03/00

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