G-R noise in submicron semiconductor layers: influence of the edges

T.G.M. Kleinpenning, S. Jarrix, G. Lecoy

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 13th International Conference on Noise in Physical Systems
Place of PublicationSingapore
PublisherWorld Scientific
Pages193-196
Publication statusPublished - 1995
Event13th International Conference on Noise in Physical Systems -
Duration: 1 Jan 1995 → …

Conference

Conference13th International Conference on Noise in Physical Systems
Period1/01/95 → …

Cite this

Kleinpenning, T. G. M., Jarrix, S., & Lecoy, G. (1995). G-R noise in submicron semiconductor layers: influence of the edges. In Proc. 13th International Conference on Noise in Physical Systems (pp. 193-196). World Scientific.