G-R noise in submicron semiconductor layers: impact of the edges

T.G.M. Kleinpenning, S. Jarrix, G. Lecoy

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. ELEN Workshop
Pages105-107
Publication statusPublished - 1994
Eventconference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994 -
Duration: 1 Jan 1994 → …

Conference

Conferenceconference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994
Period1/01/94 → …
OtherProc. ELEN Workshop, Montpellier, France, 18-20 October 1994

Cite this

Kleinpenning, T. G. M., Jarrix, S., & Lecoy, G. (1994). G-R noise in submicron semiconductor layers: impact of the edges. In Proc. ELEN Workshop (pp. 105-107)