Functional vs. multi-VDD testing of RF circuits

E. Silva, J. Pineda de Gyvez, G. Gronthoud

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    9 Citations (Scopus)
    178 Downloads (Pure)

    Abstract

    In this paper we present a comparison of the results obtained between functional testing and applying the multi-VDD approach on an RF circuit. The multi-VDD approach incorporates both VDD ramp and DC ramp techniques. The VDD ramp technique has been previously evaluated on standalone devices with good results as presented in J. Pineda de Gyvez et al. (2004) and S. Ozev and A Orailoglu (2001). However, most of the work has been accomplished in the Lab. Here we present results obtained by applying the concepts in a production environment. Correlations between the functional and the multi-VDD methodologies are shown. The studies are conducted using a WLAN 802.11a transceiver
    Original languageEnglish
    Title of host publicationProceedings of the International Test Conference, 2005, ITC 2005, 8 November 2005, Austin, Texas
    Place of PublicationNew York
    PublisherInstitute of Electrical and Electronics Engineers
    Pages17.2-1/9
    ISBN (Print)0-7803-9038-5
    DOIs
    Publication statusPublished - 2005

    Fingerprint

    Dive into the research topics of 'Functional vs. multi-VDD testing of RF circuits'. Together they form a unique fingerprint.

    Cite this