Functional nickel-based deposits synthesized by focused beam induced processing

R.M. Cordoba Castillo, B. Barcones, E. Roelfsema, M.A. Verheijen, J.J.L. Mulders, P.H.F. Trompenaars, B. Koopmans

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Abstract

Functional nanostructures fabricated by focused electron/ion beam induced processing (FEBIP/FIBIP) open a promising route for applications in nanoelectronics. Such developments rely on the exploration of new advanced materials. We report here the successful fabrication of nickel-based deposits by FEBIP/FIBIP using bis(methyl cyclopentadienyl)nickel as a precursor. In particular, binary compounds such as nickel oxide (NiO) are synthesized by using an in situ two-step process at room temperature. By this method, as-grown Ni deposits transform into homogeneous NiO deposits using focused electron beam irradiation under O2 flux. This procedure is effective in producing highly pure NiO deposits with resistivity of 2000 Ωcm and a polycrystalline structure with face-centred cubic lattice and grains of 5 nm. We demonstrate that systems based on NiO deposits displaying resistance switching and an exchange-bias effect could be grown by FEBIP using optimized parameters. Our results provide a breakthrough towards using these techniques for the fabrication of functional nanodevices.

Original languageEnglish
Article number065303
Pages (from-to)1-11
JournalNanotechnology
Volume27
Issue number6
DOIs
Publication statusPublished - 13 Jan 2016

Keywords

  • electrical properties
  • electron beam irradiation
  • exchange-bias effect
  • focused electron beam induced deposition (FEBID)
  • focused ion beam induced deposition (FIBID)
  • nickel and nickel oxide wires
  • resistance switching

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