Original language | English |
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Place of Publication | Berlin |
Publisher | Springer |
Number of pages | 216 |
ISBN (Electronic) | 978-3-662-05115-3 |
ISBN (Print) | 978-3-642-05761-8 |
DOIs | |
Publication status | Published - 2003 |
Publication series
Name | Wissenschaftsethik und Technikfolgenbeurteilung |
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Volume | 20 |