Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

J.P.M. Hoefnagels; J. Neggers; F. Hild; S. Roux; J. Beeck, van; M.G.D. Geers

Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

J.P.M. Hoefnagels, J. Neggers, F. Hild, S. Roux, J. Beeck, van, M.G.D. Geers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.

Original language	English
Title of host publication	Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France
Editors	A Chrysochoos, H. Louche, B. Wattrisse
Pages	USB flash drive-
Publication status	Published - 2013
Event	2013 PhotoMechanics - Montpellier, France Duration: 27 May 2013 → 29 May 2013

Conference

Conference	2013 PhotoMechanics
Country/Territory	France
City	Montpellier
Period	27/05/13 → 29/05/13
Other	International conference on full-field measurement techniques and their applications in experimental solid mechanics

Cite this

Hoefnagels, J. P. M., Neggers, J., Hild, F., Roux, S., Beeck, van, J., & Geers, M. G. D. (2013). Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. In A. Chrysochoos, H. Louche, & B. Wattrisse (Eds.), Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France (pp. USB flash drive-)

Hoefnagels, J.P.M. ; Neggers, J. ; Hild, F. et al. / Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. editor / A Chrysochoos ; H. Louche ; B. Wattrisse. 2013. pp. USB flash drive-

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title = "Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation",

abstract = "A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.",

author = "J.P.M. Hoefnagels and J. Neggers and F. Hild and S. Roux and {Beeck, van}, J. and M.G.D. Geers",

year = "2013",

language = "English",

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editor = "A Chrysochoos and H. Louche and B. Wattrisse",

booktitle = "Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France",

note = "2013 PhotoMechanics ; Conference date: 27-05-2013 Through 29-05-2013",

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Hoefnagels, JPM, Neggers, J, Hild, F, Roux, S, Beeck, van, J & Geers, MGD 2013, Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. in A Chrysochoos, H Louche & B Wattrisse (eds), Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. pp. USB flash drive-, 2013 PhotoMechanics, Montpellier, France, 27/05/13.

Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. / Hoefnagels, J.P.M.; Neggers, J.; Hild, F. et al.
Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. ed. / A Chrysochoos; H. Louche; B. Wattrisse. 2013. p. USB flash drive-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

AU - Hoefnagels, J.P.M.

AU - Neggers, J.

AU - Hild, F.

AU - Roux, S.

AU - Beeck, van, J.

AU - Geers, M.G.D.

PY - 2013

Y1 - 2013

N2 - A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.

AB - A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.

M3 - Conference contribution

SP - USB flash drive-

BT - Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France

A2 - Chrysochoos, A

A2 - Louche, H.

A2 - Wattrisse, B.

T2 - 2013 PhotoMechanics

Y2 - 27 May 2013 through 29 May 2013

ER -

Hoefnagels JPM, Neggers J, Hild F, Roux S, Beeck, van J, Geers MGD. Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. In Chrysochoos A, Louche H, Wattrisse B, editors, Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. 2013. p. USB flash drive-

Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

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