Fracture and delamination in microelectronic devices

L.J. Ernst, W.D. van Driel, O. Sluis, van der, A. Corigliano, A.A.O. Tay, N. Iwamoto, M.M.F. Yuen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageEnglish
Title of host publicationSmart Systems Integration and Reliability (honorary volume on the occasion of Herbert Reichel’s 65th birthday)
Place of PublicationDresden, Germany
PublisherGoldenbogen Verlag
ISBN (Print)978-3-932434-77-8
Publication statusPublished - 2010

Cite this