Forecasting transformer reliability

A. Schijndel, van, J.M. Wetzer, P.A.A.F. Wouters

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

14 Citations (Scopus)
288 Downloads (Pure)
Original languageEnglish
Title of host publicationIEEE Conference on Electrical Insulation and Dielectric Phenomena 2006
Place of PublicationKansas City
PublisherInstitute of Electrical and Electronics Engineers
Pages577-582
Publication statusPublished - 2006
Eventconference; IEEE CEIDP 2006; 2006-10-15; 2006-10-18 -
Duration: 15 Oct 200618 Oct 2006

Conference

Conferenceconference; IEEE CEIDP 2006; 2006-10-15; 2006-10-18
Period15/10/0618/10/06
OtherIEEE CEIDP 2006

Cite this

Schijndel, van, A., Wetzer, J. M., & Wouters, P. A. A. F. (2006). Forecasting transformer reliability. In IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006 (pp. 577-582). Kansas City: Institute of Electrical and Electronics Engineers.
Schijndel, van, A. ; Wetzer, J.M. ; Wouters, P.A.A.F. / Forecasting transformer reliability. IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006. Kansas City : Institute of Electrical and Electronics Engineers, 2006. pp. 577-582
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year = "2006",
language = "English",
pages = "577--582",
booktitle = "IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006",
publisher = "Institute of Electrical and Electronics Engineers",
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Schijndel, van, A, Wetzer, JM & Wouters, PAAF 2006, Forecasting transformer reliability. in IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006. Institute of Electrical and Electronics Engineers, Kansas City, pp. 577-582, conference; IEEE CEIDP 2006; 2006-10-15; 2006-10-18, 15/10/06.

Forecasting transformer reliability. / Schijndel, van, A.; Wetzer, J.M.; Wouters, P.A.A.F.

IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006. Kansas City : Institute of Electrical and Electronics Engineers, 2006. p. 577-582.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Forecasting transformer reliability

AU - Schijndel, van, A.

AU - Wetzer, J.M.

AU - Wouters, P.A.A.F.

PY - 2006

Y1 - 2006

M3 - Conference contribution

SP - 577

EP - 582

BT - IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006

PB - Institute of Electrical and Electronics Engineers

CY - Kansas City

ER -

Schijndel, van A, Wetzer JM, Wouters PAAF. Forecasting transformer reliability. In IEEE Conference on Electrical Insulation and Dielectric Phenomena 2006. Kansas City: Institute of Electrical and Electronics Engineers. 2006. p. 577-582