Focusing of ultracold ion bunches with time-dependent fields

N. Debernardi; M.P. Reijnders; T.T.J. Clevis; S.B. Geer, van der; P.H.A. Mutsaers; E.J.D. Vredenbregt; O.J. Luiten

Focusing of ultracold ion bunches with time-dependent fields

N. Debernardi, M.P. Reijnders, T.T.J. Clevis, S.B. Geer, van der, P.H.A. Mutsaers, E.J.D. Vredenbregt, O.J. Luiten

Coherence and Quantum Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Abstract

The ultra-cold ion (UCI) source is based on creating very cold ion beams by nearthreshold photo-ionization of a laser-cooled and trapped atomic gas. The UCI source has the potential of producing ion beams with a brightness and current comparable to the liquid-metal ion source (LMIS) [1], which is the current state-of-art for focused ion beam (FIB) technology. We have already shown [2] that the UCI source can provide much lower energy spread than LMIS, and may therefore offer a route toward 1-nm ion beam milling [3].

Original language	English
Title of host publication	13th ICIS International Conference on Ion Sources, Gatlinburg, Tennessee, USA, 21-25 September 2009
Pages	M7-145-
Publication status	Published - 2009

Cite this

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title = "Focusing of ultracold ion bunches with time-dependent fields",

abstract = "The ultra-cold ion (UCI) source is based on creating very cold ion beams by nearthreshold photo-ionization of a laser-cooled and trapped atomic gas. The UCI source has the potential of producing ion beams with a brightness and current comparable to the liquid-metal ion source (LMIS) [1], which is the current state-of-art for focused ion beam (FIB) technology. We have already shown [2] that the UCI source can provide much lower energy spread than LMIS, and may therefore offer a route toward 1-nm ion beam milling [3].",

author = "N. Debernardi and M.P. Reijnders and T.T.J. Clevis and {Geer, van der}, S.B. and P.H.A. Mutsaers and E.J.D. Vredenbregt and O.J. Luiten",

year = "2009",

language = "English",

pages = "M7--145--",

booktitle = "13th ICIS International Conference on Ion Sources, Gatlinburg, Tennessee, USA, 21-25 September 2009",

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Focusing of ultracold ion bunches with time-dependent fields. / Debernardi, N.; Reijnders, M.P.; Clevis, T.T.J.; Geer, van der, S.B.; Mutsaers, P.H.A.; Vredenbregt, E.J.D.; Luiten, O.J.

13th ICIS International Conference on Ion Sources, Gatlinburg, Tennessee, USA, 21-25 September 2009. 2009. p. M7-145-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Focusing of ultracold ion bunches with time-dependent fields

AU - Debernardi, N.

AU - Reijnders, M.P.

AU - Clevis, T.T.J.

AU - Geer, van der, S.B.

AU - Mutsaers, P.H.A.

AU - Vredenbregt, E.J.D.

AU - Luiten, O.J.

PY - 2009

Y1 - 2009

N2 - The ultra-cold ion (UCI) source is based on creating very cold ion beams by nearthreshold photo-ionization of a laser-cooled and trapped atomic gas. The UCI source has the potential of producing ion beams with a brightness and current comparable to the liquid-metal ion source (LMIS) [1], which is the current state-of-art for focused ion beam (FIB) technology. We have already shown [2] that the UCI source can provide much lower energy spread than LMIS, and may therefore offer a route toward 1-nm ion beam milling [3].

AB - The ultra-cold ion (UCI) source is based on creating very cold ion beams by nearthreshold photo-ionization of a laser-cooled and trapped atomic gas. The UCI source has the potential of producing ion beams with a brightness and current comparable to the liquid-metal ion source (LMIS) [1], which is the current state-of-art for focused ion beam (FIB) technology. We have already shown [2] that the UCI source can provide much lower energy spread than LMIS, and may therefore offer a route toward 1-nm ion beam milling [3].

M3 - Conference contribution

SP - M7-145-

BT - 13th ICIS International Conference on Ion Sources, Gatlinburg, Tennessee, USA, 21-25 September 2009

ER -

Focusing of ultracold ion bunches with time-dependent fields

Abstract

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