Skip to main navigation Skip to search Skip to main content

Flexible metal-oxide thin film transistor circuits for RFID and health patches

  • P. Heremans
  • , N. Papadopoulos
  • , A. de Jamblinne de Meux
  • , M. Nag
  • , S. Steudel
  • , M. Rockele
  • , G.H. Gelinck
  • , A.K. Tripathi
  • , J. Genoe
  • , K. Myny

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Abstract

We discuss in this paper the present state and future perspectives of thin-film oxide transistors for flexible electronics. The application case that we focus on is a flexible health patch containing an analog sensor interface as well as digital electronics to transmit the acquired data wirelessly to a base station. We examine the electronic performance of amorphous Indium-Gallium-Zinc-Oxide (a-IGZO) during mechanical bending. We discuss several ways to further boost the electronic transistor performance of n-type amorphous oxide semiconductors, by modifying the semiconductor or by improving the transistor architecture. We show analog and digital circuits constructed with several architectures, all based on n-type-only amorphous oxide technology. From circuit point of view, the discovery of a p-type amorphous semiconductor matching known n-type amorphous semiconductors would be of great importance. The present best-suited p-type is SnO, but it is poly-crystalline in nature and shows some ambipolarity due to the presence of n-type SnO2. In search of a better p-type semiconductor, preferably amorphous, we present recent insights into the band structure of potential amorphous oxide p-type semiconductors.

Original languageEnglish
Title of host publication2016 IEEE International Electron Devices Meeting, IEDM 2016
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages6.3.1-6.3.4
Number of pages4
ISBN (Electronic)978-1-5090-3902-9
DOIs
Publication statusPublished - 31 Jan 2017
Event2016 IEEE International Electron Devices Meeting, IEDM 2016 - San Francisco, United States
Duration: 3 Dec 20167 Dec 2016
Conference number: 62

Conference

Conference2016 IEEE International Electron Devices Meeting, IEDM 2016
Abbreviated titleIEDM 2016
Country/TerritoryUnited States
CitySan Francisco
Period3/12/167/12/16

Fingerprint

Dive into the research topics of 'Flexible metal-oxide thin film transistor circuits for RFID and health patches'. Together they form a unique fingerprint.

Cite this