Abstract
We discuss in this paper the present state and future perspectives of thin-film oxide transistors for flexible electronics. The application case that we focus on is a flexible health patch containing an analog sensor interface as well as digital electronics to transmit the acquired data wirelessly to a base station. We examine the electronic performance of amorphous Indium-Gallium-Zinc-Oxide (a-IGZO) during mechanical bending. We discuss several ways to further boost the electronic transistor performance of n-type amorphous oxide semiconductors, by modifying the semiconductor or by improving the transistor architecture. We show analog and digital circuits constructed with several architectures, all based on n-type-only amorphous oxide technology. From circuit point of view, the discovery of a p-type amorphous semiconductor matching known n-type amorphous semiconductors would be of great importance. The present best-suited p-type is SnO, but it is poly-crystalline in nature and shows some ambipolarity due to the presence of n-type SnO2. In search of a better p-type semiconductor, preferably amorphous, we present recent insights into the band structure of potential amorphous oxide p-type semiconductors.
Original language | English |
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Title of host publication | 2016 IEEE International Electron Devices Meeting, IEDM 2016 |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 6.3.1-6.3.4 |
Number of pages | 4 |
ISBN (Electronic) | 978-1-5090-3902-9 |
DOIs | |
Publication status | Published - 31 Jan 2017 |
Event | 2016 IEEE International Electron Devices Meeting, IEDM 2016 - San Francisco, United States Duration: 3 Dec 2016 → 7 Dec 2016 Conference number: 62 |
Conference
Conference | 2016 IEEE International Electron Devices Meeting, IEDM 2016 |
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Abbreviated title | IEDM 2016 |
Country/Territory | United States |
City | San Francisco |
Period | 3/12/16 → 7/12/16 |