TY - JOUR
T1 - Finding days-of-week representation for intelligent machine usage profiling
AU - Chang, Chiming
AU - Verhaegen, P.A.
AU - Duflou, J.R.
AU - Drugan, M.M.
AU - Nowe, A.
PY - 2013
Y1 - 2013
N2 - Usage profiles of a smart appliance predict how the machine is expected to interact with its users according to its usage history, but, the problem of building usage profiles has been scarcely discussed in the literature. In this paper, we discuss general aspects of generating usage profiles and propose a daily pattern based probability model for usage profiling. We show how the probability models can be learned with Bayesian network classifiers and we highlight the importance of finding the optimal days-of-the-week representation. An algorithm using the conditional log-likelihood minimum description length (CMDL) and hierarchical clustering is designed to find the representation. The learned model is then used in a Bayesian network classifier setting to predict usage profiles. The methodology is tested on a real-life dataset of office printers in a campus environment.
AB - Usage profiles of a smart appliance predict how the machine is expected to interact with its users according to its usage history, but, the problem of building usage profiles has been scarcely discussed in the literature. In this paper, we discuss general aspects of generating usage profiles and propose a daily pattern based probability model for usage profiling. We show how the probability models can be learned with Bayesian network classifiers and we highlight the importance of finding the optimal days-of-the-week representation. An algorithm using the conditional log-likelihood minimum description length (CMDL) and hierarchical clustering is designed to find the representation. The learned model is then used in a Bayesian network classifier setting to predict usage profiles. The methodology is tested on a real-life dataset of office printers in a campus environment.
U2 - 10.12720/jiii.1.3.148-154
DO - 10.12720/jiii.1.3.148-154
M3 - Article
SN - 2301-3745
VL - 1
SP - 148
EP - 154
JO - Journal of Industrial and Intelligent Information
JF - Journal of Industrial and Intelligent Information
IS - 3
ER -