Feedback insensitive integrated semiconductor ring laser concept using weak intracavity isolation

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Abstract

External optical feedback can influence semiconductor laser performance to a great extent. Strong optical isolators with reasonable insertion loss are not available in a photonic integrated circuit due to material incompatibilities, preventing the use of an isolator external to the laser cavity to suppress any feedback effects. In this work the feedback sensitivity of a semiconductor ring laser with an intra-cavity isolation of less than 10 dB is studied using a rate equation analysis. It is found that the relative intensity noise and linewidth are insensitive to feedback strengths over -10 dB.
Original languageEnglish
Title of host publication2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 24-28 July 2017, Copenhagen, Denmark
EditorsMorten Willatzen, Joachim Piprek
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages183-184
Number of pages2
ISBN (Electronic)978-1-5090-5323-0
ISBN (Print)978-1-5090-5324-7
DOIs
Publication statusPublished - 26 Jul 2017
Event17th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD 2017), 24-28 July 2017, Copenhagen, denmark - Copenhagen, Denmark
Duration: 24 Jul 201728 Jul 2017
Conference number: 17
http://www.nusod.org/2017/

Conference

Conference17th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD 2017), 24-28 July 2017, Copenhagen, denmark
Abbreviated titleNUSOD
CountryDenmark
CityCopenhagen
Period24/07/1728/07/17
Internet address

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Cite this

van Schaijk, T. T. M., Lenstra, D., Bente, E. A. J. M., & Williams, K. A. (2017). Feedback insensitive integrated semiconductor ring laser concept using weak intracavity isolation. In M. Willatzen, & J. Piprek (Eds.), 2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 24-28 July 2017, Copenhagen, Denmark (pp. 183-184). [8010052] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/NUSOD.2017.8010052