Faulty EPCs in the SAP reference model

J. Mendling; M. Moser; G. Neumann; H.M.W. Verbeek; B.F. Dongen, van; W.M.P. Aalst, van der

doi:10.1007/11841760_38

Faulty EPCs in the SAP reference model

J. Mendling
, M. Moser
, G. Neumann
, H.M.W. Verbeek
, B.F. Dongen, van
, W.M.P. Aalst, van der

Information Systems IE&IS

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

54 Citations (Scopus)

Abstract

Little is known about error probability in enterprise models as they are usually kept private. The SAP reference model is a publically available model that contains more than 600 non-trivial process models expressed in terms of Event-driven Process Chains (EPCs). We have automatically translated these EPCs into YAWL models and analyzed these models using WofYAWL, a verification tool based on Petri nets, in order to acquire knowledge about errors in large enterprise models. We discovered that at least 34 of these EPCs contain errors (i.e., at least 5.6% is flawed) and analyzed which parts of the SAP reference model contain most errors. This systematic analysis of the SAP reference model illustrates the need for verification tools such as WofYAWL.

Original language	English
Title of host publication	Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006)
Editors	S. Dustdar, J.L. Fiadeiro, A. Sheth
Place of Publication	Berlin
Publisher	Springer
Pages	451-457
ISBN (Print)	3-540-38901-6
DOIs	https://doi.org/10.1007/11841760_38
Publication status	Published - 2006

Publication series

Name	Lecture Notes in Computer Science
Volume	4102
ISSN (Print)	0302-9743

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10.1007/11841760_38

Cite this

Mendling, J., Moser, M., Neumann, G., Verbeek, H. M. W., Dongen, van, B. F., & Aalst, van der, W. M. P. (2006). Faulty EPCs in the SAP reference model. In S. Dustdar, J. L. Fiadeiro, & A. Sheth (Eds.), Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006) (pp. 451-457). (Lecture Notes in Computer Science; Vol. 4102). Springer. https://doi.org/10.1007/11841760_38

@inproceedings{646a67ad0f0e4df7ba3e6158fbaf9062,

title = "Faulty EPCs in the SAP reference model",

abstract = "Little is known about error probability in enterprise models as they are usually kept private. The SAP reference model is a publically available model that contains more than 600 non-trivial process models expressed in terms of Event-driven Process Chains (EPCs). We have automatically translated these EPCs into YAWL models and analyzed these models using WofYAWL, a verification tool based on Petri nets, in order to acquire knowledge about errors in large enterprise models. We discovered that at least 34 of these EPCs contain errors (i.e., at least 5.6\% is flawed) and analyzed which parts of the SAP reference model contain most errors. This systematic analysis of the SAP reference model illustrates the need for verification tools such as WofYAWL.",

author = "J. Mendling and M. Moser and G. Neumann and H.M.W. Verbeek and \{Dongen, van\}, B.F. and \{Aalst, van der\}, W.M.P.",

year = "2006",

doi = "10.1007/11841760\_38",

language = "English",

isbn = "3-540-38901-6",

series = "Lecture Notes in Computer Science",

publisher = "Springer",

pages = "451--457",

editor = "S. Dustdar and J.L. Fiadeiro and A. Sheth",

booktitle = "Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006)",

address = "Germany",

}

Mendling, J, Moser, M, Neumann, G, Verbeek, HMW , Dongen, van, BF & Aalst, van der, WMP 2006, Faulty EPCs in the SAP reference model. in S Dustdar, JL Fiadeiro & A Sheth (eds), Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006). Lecture Notes in Computer Science, vol. 4102, Springer, Berlin, pp. 451-457. https://doi.org/10.1007/11841760_38

Faulty EPCs in the SAP reference model. / Mendling, J.; Moser, M.; Neumann, G. et al.
Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006). ed. / S. Dustdar; J.L. Fiadeiro; A. Sheth. Berlin: Springer, 2006. p. 451-457 (Lecture Notes in Computer Science; Vol. 4102).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Faulty EPCs in the SAP reference model

AU - Mendling, J.

AU - Moser, M.

AU - Neumann, G.

AU - Verbeek, H.M.W.

AU - Dongen, van, B.F.

AU - Aalst, van der, W.M.P.

PY - 2006

Y1 - 2006

N2 - Little is known about error probability in enterprise models as they are usually kept private. The SAP reference model is a publically available model that contains more than 600 non-trivial process models expressed in terms of Event-driven Process Chains (EPCs). We have automatically translated these EPCs into YAWL models and analyzed these models using WofYAWL, a verification tool based on Petri nets, in order to acquire knowledge about errors in large enterprise models. We discovered that at least 34 of these EPCs contain errors (i.e., at least 5.6% is flawed) and analyzed which parts of the SAP reference model contain most errors. This systematic analysis of the SAP reference model illustrates the need for verification tools such as WofYAWL.

AB - Little is known about error probability in enterprise models as they are usually kept private. The SAP reference model is a publically available model that contains more than 600 non-trivial process models expressed in terms of Event-driven Process Chains (EPCs). We have automatically translated these EPCs into YAWL models and analyzed these models using WofYAWL, a verification tool based on Petri nets, in order to acquire knowledge about errors in large enterprise models. We discovered that at least 34 of these EPCs contain errors (i.e., at least 5.6% is flawed) and analyzed which parts of the SAP reference model contain most errors. This systematic analysis of the SAP reference model illustrates the need for verification tools such as WofYAWL.

U2 - 10.1007/11841760_38

DO - 10.1007/11841760_38

M3 - Conference contribution

SN - 3-540-38901-6

T3 - Lecture Notes in Computer Science

SP - 451

EP - 457

BT - Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006)

A2 - Dustdar, S.

A2 - Fiadeiro, J.L.

A2 - Sheth, A.

PB - Springer

CY - Berlin

ER -

Mendling J, Moser M, Neumann G, Verbeek HMW , Dongen, van BF, Aalst, van der WMP. Faulty EPCs in the SAP reference model. In Dustdar S, Fiadeiro JL, Sheth A, editors, Business Process Management (Proceedings 4th International Conference, BPM 2006, Vienna, Austria, September 5-7, 2006). Berlin: Springer. 2006. p. 451-457. (Lecture Notes in Computer Science). doi: 10.1007/11841760_38

Faulty EPCs in the SAP reference model

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