Fault localization improvement through an intra-cell diagnosis approach

Zhenzhou Sun; Alberto Bosio; Luigi Dilillo; Patrick Girard; Aida Todri; Arnaud Virazel; Etienne Auvray

Fault localization improvement through an intra-cell diagnosis approach

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new "Effect-Cause" based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.

Original language	English
Title of host publication	ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis
Publisher	ASM International
Pages	509-519
Number of pages	11
ISBN (Print)	9781615039791
Publication status	Published - 2012
Externally published	Yes
Event	38th International Symposium for Testing and Failure Analysis, ISTFA 2012 - Phoenix, AZ, United States Duration: 11 Nov 2012 → 15 Nov 2012

Conference

Conference	38th International Symposium for Testing and Failure Analysis, ISTFA 2012
Country/Territory	United States
City	Phoenix, AZ
Period	11/11/12 → 15/11/12

Keywords

CPT
Effect-Cause approach
Failure analysis
Intra-cell diagnosis
Logic diagnosis

Cite this

@inproceedings{216323364a404745bcc4c67ceb0d3d89,

title = "Fault localization improvement through an intra-cell diagnosis approach",

abstract = "Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new {"}Effect-Cause{"} based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.",

keywords = "CPT, Effect-Cause approach, Failure analysis, Intra-cell diagnosis, Logic diagnosis",

author = "Zhenzhou Sun and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Etienne Auvray",

year = "2012",

language = "English",

isbn = "9781615039791",

pages = "509--519",

booktitle = "ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis",

publisher = "ASM International",

address = "United States",

note = "38th International Symposium for Testing and Failure Analysis, ISTFA 2012 ; Conference date: 11-11-2012 Through 15-11-2012",

}

Sun, Z, Bosio, A, Dilillo, L, Girard, P, Todri, A, Virazel, A & Auvray, E 2012, Fault localization improvement through an intra-cell diagnosis approach. in ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International, pp. 509-519, 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix, AZ, United States, 11/11/12.

Fault localization improvement through an intra-cell diagnosis approach. / Sun, Zhenzhou; Bosio, Alberto; Dilillo, Luigi et al.
ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International, 2012. p. 509-519.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Fault localization improvement through an intra-cell diagnosis approach

AU - Sun, Zhenzhou

AU - Bosio, Alberto

AU - Dilillo, Luigi

AU - Girard, Patrick

AU - Todri, Aida

AU - Virazel, Arnaud

AU - Auvray, Etienne

PY - 2012

Y1 - 2012

N2 - Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new "Effect-Cause" based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.

AB - Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new "Effect-Cause" based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.

KW - CPT

KW - Effect-Cause approach

KW - Failure analysis

KW - Intra-cell diagnosis

KW - Logic diagnosis

UR - http://www.scopus.com/inward/record.url?scp=84874333782&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84874333782

SN - 9781615039791

SP - 509

EP - 519

BT - ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis

PB - ASM International

T2 - 38th International Symposium for Testing and Failure Analysis, ISTFA 2012

Y2 - 11 November 2012 through 15 November 2012

ER -

Fault localization improvement through an intra-cell diagnosis approach

Abstract

Conference

Keywords

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