Fault diagnosis using dynamic finite-state automation

Y.X. Xi, K.W. Lim, W.K. Ho, H.A. Preisig

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	IECON'01, Denver, Colorado, USA
Publication status	Published - 2001
Event	27th Annual Conference of the IEEE Industrial Electronics Society, IECON 2001 - Denver, United States Duration: 29 Nov 2001 → 2 Dec 2001 Conference number: 27

Conference	27th Annual Conference of the IEEE Industrial Electronics Society, IECON 2001
Abbreviated title	IECON 2001
Country/Territory	United States
City	Denver
Period	29/11/01 → 2/12/01

Cite this

@inproceedings{cdfb4361b54e4c3baefe620d38bc86a3,

title = "Fault diagnosis using dynamic finite-state automation",

author = "Y.X. Xi and K.W. Lim and W.K. Ho and H.A. Preisig",

year = "2001",

language = "English",

booktitle = "IECON'01, Denver, Colorado, USA",

note = "27th Annual Conference of the IEEE Industrial Electronics Society, IECON 2001, IECON 2001 ; Conference date: 29-11-2001 Through 02-12-2001",

}

TY - GEN

T1 - Fault diagnosis using dynamic finite-state automation

AU - Xi, Y.X.

AU - Lim, K.W.

AU - Ho, W.K.

AU - Preisig, H.A.

N1 - Conference code: 27

PY - 2001

Y1 - 2001

M3 - Conference contribution

BT - IECON'01, Denver, Colorado, USA

T2 - 27th Annual Conference of the IEEE Industrial Electronics Society, IECON 2001

Y2 - 29 November 2001 through 2 December 2001

ER -