Fast time-domain simulation for reliable fault detection

Bratislav Tasić, Jos J. Dohmen, Rick Janssen, E. Jan W. ter Maten, Theo G.J. Beelen, Roland Pulch

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, "golden", design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider "opens" (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the golden solution and all faulty solutions are calculated over the same time step.

Original languageEnglish
Title of host publicationProceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages301-306
Number of pages6
ISBN (Electronic)9783981537062
Publication statusPublished - 25 Apr 2016
Event19th Design, Automation and Test in Europe Conference and Exhibition, DATE 2016 - Dresden, Germany
Duration: 14 Mar 201618 Mar 2016

Conference

Conference19th Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
CountryGermany
CityDresden
Period14/03/1618/03/16

Fingerprint Dive into the research topics of 'Fast time-domain simulation for reliable fault detection'. Together they form a unique fingerprint.

  • Cite this

    Tasić, B., Dohmen, J. J., Janssen, R., ter Maten, E. J. W., Beelen, T. G. J., & Pulch, R. (2016). Fast time-domain simulation for reliable fault detection. In Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016 (pp. 301-306). [7459327] Piscataway: Institute of Electrical and Electronics Engineers.