Fast time-domain simulation for reliable fault detection

B. Tasic; J.J. Dohmen; R.I.J. Janssen; E.J.W. ter Maten; T.G.J. Beelen; R. Pulch

Fast time-domain simulation for reliable fault detection

B. Tasic, J.J. Dohmen, R.I.J. Janssen, E.J.W. ter Maten, T.G.J. Beelen, R. Pulch

Research output: Book/Report › Report › Academic

79 Downloads (Pure)

Abstract

Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, ”golden”, design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider ”opens” (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the golden
solution and all faulty solutions are calculated over the same time step.

Original language	English
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Number of pages	6
Publication status	Published - Mar 2016

Publication series

Name	CASA-report
Volume	1603
ISSN (Print)	0926-4507

Access to Document

publishers versionFinal published version, 774 KB

Fingerprint Dive into the research topics of 'Fast time-domain simulation for reliable fault detection'. Together they form a unique fingerprint.

Cite this

Tasic, B., Dohmen, J. J., Janssen, R. I. J., ter Maten, E. J. W., Beelen, T. G. J., & Pulch, R. (2016). Fast time-domain simulation for reliable fault detection. (CASA-report; Vol. 1603). Eindhoven: Technische Universiteit Eindhoven.

@book{7d8447a6612d491289ce146c382a83bb,

title = "Fast time-domain simulation for reliable fault detection",

abstract = "Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, ”golden”, design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider ”opens” (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the goldensolution and all faulty solutions are calculated over the same time step.",

author = "B. Tasic and J.J. Dohmen and R.I.J. Janssen and {ter Maten}, E.J.W. and T.G.J. Beelen and R. Pulch",

year = "2016",

month = "3",

language = "English",

series = "CASA-report",

publisher = "Technische Universiteit Eindhoven",

}

TY - BOOK

T1 - Fast time-domain simulation for reliable fault detection

AU - Tasic, B.

AU - Dohmen, J.J.

AU - Janssen, R.I.J.

AU - ter Maten, E.J.W.

AU - Beelen, T.G.J.

AU - Pulch, R.

PY - 2016/3

Y1 - 2016/3

N2 - Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, ”golden”, design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider ”opens” (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the goldensolution and all faulty solutions are calculated over the same time step.

AB - Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, ”golden”, design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider ”opens” (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the goldensolution and all faulty solutions are calculated over the same time step.

M3 - Report

T3 - CASA-report

BT - Fast time-domain simulation for reliable fault detection

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -