Fast and robust method for measuring semiconductor optical amplifier gain

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91 Downloads (Pure)

Abstract

In this paper, we present a new, robust multipoint fitting method for gain measurement with a metric for quality estimation of the procedure. The method is able to identify the deleterious effect of imperfections within the test structures, is tolerant to optical coupling errors and is well suited to high throughput, generic, automated testing of semiconductor optical amplifiers. Gain is estimated in a range of pump current densities over multiple spectral bands from 1400 to 1600 nm with a standard error in the order of 1/cm.

Original languageEnglish
Article number8004439
Number of pages9
JournalIEEE Journal of Selected Topics in Quantum Electronics
Volume24
Issue number1
DOIs
Publication statusPublished - 1 Jan 2018

Fingerprint

Semiconductor optical amplifiers
light amplifiers
Gain measurement
optical coupling
spectral bands
Current density
Throughput
Pumps
pumps
current density
Defects
defects
Testing

Keywords

  • active-passive integration
  • Gain measurement
  • photonic integrated circuits
  • segmented device
  • semiconductor optical amplifiers

Cite this

@article{8a9a1cb2a00045cab56c6ee1dbb12280,
title = "Fast and robust method for measuring semiconductor optical amplifier gain",
abstract = "In this paper, we present a new, robust multipoint fitting method for gain measurement with a metric for quality estimation of the procedure. The method is able to identify the deleterious effect of imperfections within the test structures, is tolerant to optical coupling errors and is well suited to high throughput, generic, automated testing of semiconductor optical amplifiers. Gain is estimated in a range of pump current densities over multiple spectral bands from 1400 to 1600 nm with a standard error in the order of 1/cm.",
keywords = "active-passive integration, Gain measurement, photonic integrated circuits, segmented device, semiconductor optical amplifiers",
author = "D. Pustakhod and K. Williams and X. Leijtens",
year = "2018",
month = "1",
day = "1",
doi = "10.1109/JSTQE.2017.2737581",
language = "English",
volume = "24",
journal = "IEEE Journal of Selected Topics in Quantum Electronics",
issn = "1077-260X",
publisher = "Institute of Electrical and Electronics Engineers",
number = "1",

}

Fast and robust method for measuring semiconductor optical amplifier gain. / Pustakhod, D.; Williams, K.; Leijtens, X.

In: IEEE Journal of Selected Topics in Quantum Electronics, Vol. 24, No. 1, 8004439, 01.01.2018.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Fast and robust method for measuring semiconductor optical amplifier gain

AU - Pustakhod, D.

AU - Williams, K.

AU - Leijtens, X.

PY - 2018/1/1

Y1 - 2018/1/1

N2 - In this paper, we present a new, robust multipoint fitting method for gain measurement with a metric for quality estimation of the procedure. The method is able to identify the deleterious effect of imperfections within the test structures, is tolerant to optical coupling errors and is well suited to high throughput, generic, automated testing of semiconductor optical amplifiers. Gain is estimated in a range of pump current densities over multiple spectral bands from 1400 to 1600 nm with a standard error in the order of 1/cm.

AB - In this paper, we present a new, robust multipoint fitting method for gain measurement with a metric for quality estimation of the procedure. The method is able to identify the deleterious effect of imperfections within the test structures, is tolerant to optical coupling errors and is well suited to high throughput, generic, automated testing of semiconductor optical amplifiers. Gain is estimated in a range of pump current densities over multiple spectral bands from 1400 to 1600 nm with a standard error in the order of 1/cm.

KW - active-passive integration

KW - Gain measurement

KW - photonic integrated circuits

KW - segmented device

KW - semiconductor optical amplifiers

UR - http://www.scopus.com/inward/record.url?scp=85028914967&partnerID=8YFLogxK

U2 - 10.1109/JSTQE.2017.2737581

DO - 10.1109/JSTQE.2017.2737581

M3 - Article

AN - SCOPUS:85028914967

VL - 24

JO - IEEE Journal of Selected Topics in Quantum Electronics

JF - IEEE Journal of Selected Topics in Quantum Electronics

SN - 1077-260X

IS - 1

M1 - 8004439

ER -