Failure prediction of IC}interconnect structures using cohesive zone modelling

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Fracture of Nano and Engineering Materials and Structures
Place of Publication	Greece, Alexandroupolis
Pages	on-CDROM
Publication status	Published - 2006

Cite this

@inproceedings{aa863df859744824baae920acd891d23,

title = "Failure prediction of IC\}interconnect structures using cohesive zone modelling",

author = "\{Hal, van\}, B.A.E. and R.H.J. Peerlings and M.G.D. Geers and G.Q. Zhang",

year = "2006",

language = "English",

pages = "on--CDROM",

booktitle = "Fracture of Nano and Engineering Materials and Structures",

}