Failure prediction of IC}interconnect structures using cohesive zone modelling

B.A.E. Hal, van, R.H.J. Peerlings, M.G.D. Geers, G.Q. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationFracture of Nano and Engineering Materials and Structures
Place of PublicationGreece, Alexandroupolis
Pageson-CDROM
Publication statusPublished - 2006

Cite this