Factorized test generation for multi-input/output transition systems

E. Brinksma, L. Heerink, J. Tretmans

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationTesting of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998)
EditorsA. Petrenko, N. Yevtushenko
PublisherKluwer
Pages67-82
ISBN (Print)0-412-84430-3
Publication statusPublished - 1998

Publication series

NameIFIP Conference Proceedings
Volume131
ISSN (Print)1571-5736

Cite this

Brinksma, E., Heerink, L., & Tretmans, J. (1998). Factorized test generation for multi-input/output transition systems. In A. Petrenko, & N. Yevtushenko (Eds.), Testing of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998) (pp. 67-82). (IFIP Conference Proceedings; Vol. 131). Kluwer.
Brinksma, E. ; Heerink, L. ; Tretmans, J. / Factorized test generation for multi-input/output transition systems. Testing of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998). editor / A. Petrenko ; N. Yevtushenko. Kluwer, 1998. pp. 67-82 (IFIP Conference Proceedings).
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title = "Factorized test generation for multi-input/output transition systems",
author = "E. Brinksma and L. Heerink and J. Tretmans",
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series = "IFIP Conference Proceedings",
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Brinksma, E, Heerink, L & Tretmans, J 1998, Factorized test generation for multi-input/output transition systems. in A Petrenko & N Yevtushenko (eds), Testing of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998). IFIP Conference Proceedings, vol. 131, Kluwer, pp. 67-82.

Factorized test generation for multi-input/output transition systems. / Brinksma, E.; Heerink, L.; Tretmans, J.

Testing of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998). ed. / A. Petrenko; N. Yevtushenko. Kluwer, 1998. p. 67-82 (IFIP Conference Proceedings; Vol. 131).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Factorized test generation for multi-input/output transition systems

AU - Brinksma, E.

AU - Heerink, L.

AU - Tretmans, J.

PY - 1998

Y1 - 1998

M3 - Conference contribution

SN - 0-412-84430-3

T3 - IFIP Conference Proceedings

SP - 67

EP - 82

BT - Testing of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998)

A2 - Petrenko, A.

A2 - Yevtushenko, N.

PB - Kluwer

ER -

Brinksma E, Heerink L, Tretmans J. Factorized test generation for multi-input/output transition systems. In Petrenko A, Yevtushenko N, editors, Testing of Communication Systems (Proceedings of the IFIP TC6 11th International Workshop, IWTCS, Tomsk, Russia, August 31-September 2, 1998). Kluwer. 1998. p. 67-82. (IFIP Conference Proceedings).