Abstract
A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.
Original language | English |
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Pages (from-to) | 1764-1772 |
Number of pages | 9 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 39 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2004 |