A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.
Nenadovic, N., Mijalkovic, S., Nanver, L. K., Vandamme, L. K. J., Alessandro, d', V., Schellevis, H., & Slotboom, J. W. (2004). Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors. IEEE Journal of Solid-State Circuits, 39(10), 1764-1772. https://doi.org/10.1109/JSSC.2004.833766