Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

N. Nenadovic, S. Mijalkovic, L.K. Nanver, L.K.J. Vandamme, V. Alessandro, d', H. Schellevis, J.W. Slotboom

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Abstract

A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.
Original languageEnglish
Pages (from-to)1764-1772
Number of pages9
JournalIEEE Journal of Solid-State Circuits
Volume39
Issue number10
DOIs
Publication statusPublished - 2004

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