Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

N. Nenadovic; S. Mijalkovic; L.K. Nanver; L.K.J. Vandamme; V. Alessandro, d'; H. Schellevis; J.W. Slotboom

doi:10.1109/JSSC.2004.833766

Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

N. Nenadovic, S. Mijalkovic, L.K. Nanver, L.K.J. Vandamme, V. Alessandro, d', H. Schellevis, J.W. Slotboom

Integrated Circuits

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.

Original language	English
Pages (from-to)	1764-1772
Number of pages	9
Journal	IEEE Journal of Solid-State Circuits
Volume	39
Issue number	10
DOIs	https://doi.org/10.1109/JSSC.2004.833766
Publication status	Published - 2004

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title = "Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors",

abstract = "A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.",

author = "N. Nenadovic and S. Mijalkovic and L.K. Nanver and L.K.J. Vandamme and {Alessandro, d'}, V. and H. Schellevis and J.W. Slotboom",

year = "2004",

doi = "10.1109/JSSC.2004.833766",

language = "English",

volume = "39",

pages = "1764--1772",

journal = "IEEE Journal of Solid-State Circuits",

issn = "0018-9200",

publisher = "Institute of Electrical and Electronics Engineers",

number = "10",

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Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors. / Nenadovic, N.; Mijalkovic, S.; Nanver, L.K.; Vandamme, L.K.J.; Alessandro, d', V.; Schellevis, H.; Slotboom, J.W.

In: IEEE Journal of Solid-State Circuits, Vol. 39, No. 10, 2004, p. 1764-1772.

Research output: Contribution to journal › Article › Academic › peer-review

TY - JOUR

T1 - Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

AU - Nenadovic, N.

AU - Mijalkovic, S.

AU - Nanver, L.K.

AU - Vandamme, L.K.J.

AU - Alessandro, d', V.

AU - Schellevis, H.

AU - Slotboom, J.W.

PY - 2004

Y1 - 2004

N2 - A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.

AB - A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.

U2 - 10.1109/JSSC.2004.833766

DO - 10.1109/JSSC.2004.833766

M3 - Article

VL - 39

SP - 1764

EP - 1772

JO - IEEE Journal of Solid-State Circuits

JF - IEEE Journal of Solid-State Circuits

SN - 0018-9200

IS - 10

ER -

Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

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