Extended X-ray absorbtion fine structure study of arsenic in HgCdTe

S.R. Plissard, G. Giusti, B. Polge, P. Ballet, A. Million, X. Biquard, E. Molva, J.P. Barnes, P. Holliger

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	919-924
Journal	Journal of Electronic Materials
Volume	36
Issue number	8
DOIs	https://doi.org/10.1007/s11664-007-0133-5
Publication status	Published - 2007
Externally published	Yes

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title = "Extended X-ray absorbtion fine structure study of arsenic in HgCdTe",

author = "S.R. Plissard and G. Giusti and B. Polge and P. Ballet and A. Million and X. Biquard and E. Molva and J.P. Barnes and P. Holliger",

year = "2007",

doi = "10.1007/s11664-007-0133-5",

language = "English",

volume = "36",

pages = "919--924",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

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T1 - Extended X-ray absorbtion fine structure study of arsenic in HgCdTe

AU - Plissard, S.R.

AU - Giusti, G.

AU - Polge, B.

AU - Ballet, P.

AU - Million, A.

AU - Biquard, X.

AU - Molva, E.

AU - Barnes, J.P.

AU - Holliger, P.

PY - 2007

Y1 - 2007

U2 - 10.1007/s11664-007-0133-5

DO - 10.1007/s11664-007-0133-5

M3 - Article

SN - 0361-5235

VL - 36

SP - 919

EP - 924

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 8

ER -