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Extended Abstract: An Interpretable Semi-supervised Classifier using Rough Sets for Amended Self-labeling

  • Isel Grau
  • , Dipankar Sengupta
  • , Maria Matilde Garcia Lorenzo
  • , Ann Nowe

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the 32th Benelux Conference on Artificial Intelligence and the 29th Belgian Dutch Conference on Machine Learning (BNAIC/BENELEARN 2020)
EditorsLu Cao, Walter Kosters, Jefrey Lijffijt
PublisherUniversiteit Leiden
Pages376-377
Number of pages2
Publication statusPublished - 2020
Externally publishedYes

Publication series

NameBelgian/Netherlands Artificial Intelligence Conference
ISSN (Print)1568-7805

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