Exploiting functional dependences in finite state machine verification

C.A.J. Eijk, van, J.A.G. Jess

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. European Design and Test Conference, ED&TC
Pages	9-14
Publication status	Published - 1996
Event	1996 European Design and Test Conference (ED&TC 1996) - Paris, France Duration: 11 Mar 1996 → 14 Mar 1996

Conference	1996 European Design and Test Conference (ED&TC 1996)
Abbreviated title	ED&TC 1996
Country/Territory	France
City	Paris
Period	11/03/96 → 14/03/96
Other

Cite this

@inproceedings{9fb8919655e94180a5705c46604ae2d6,

title = "Exploiting functional dependences in finite state machine verification",

author = "\{Eijk, van\}, C.A.J. and J.A.G. Jess",

year = "1996",

language = "English",

pages = "9--14",

booktitle = "Proc. European Design and Test Conference, ED\&TC",

note = "1996 European Design and Test Conference (ED\&TC 1996)<br/>, ED\&TC 1996 ; Conference date: 11-03-1996 Through 14-03-1996",

}