Exploiting functional dependences in finite state machine verification

C.A.J. Eijk, van, J.A.G. Jess

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. European Design and Test Conference, ED&TC
Pages9-14
Publication statusPublished - 1996
Event1996 European Design and Test Conference (ED&TC 1996)
- Paris, France
Duration: 11 Mar 199614 Mar 1996

Conference

Conference1996 European Design and Test Conference (ED&TC 1996)
Abbreviated titleED&TC 1996
Country/TerritoryFrance
CityParis
Period11/03/9614/03/96
Other

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