Exciton dynamics in ultrathin InAs/GaAs quantum-wells

J. Brübach, J.E.M. Haverkort, J.H. Wolter, P.D. Wang, N.N. Ledentsov, C.M. Sotomayor Torres

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationDiagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A
EditorsS.W. Pang
PublisherMaterials Research Society
Pages283-288
ISBN (Print)1-558-99309-6
DOIs
Publication statusPublished - 1996
EventDiagnostic Techniques for Semiconductor Materials Processing II, Symposium held at the 1995 MRS Fall Meeting 1995 - Boston, United States
Duration: 27 Nov 199530 Nov 1995

Publication series

NameMaterials Research Society Symposium Proceedings
Volume406
ISSN (Print)0272-9172

Conference

ConferenceDiagnostic Techniques for Semiconductor Materials Processing II, Symposium held at the 1995 MRS Fall Meeting 1995
CountryUnited States
CityBoston
Period27/11/9530/11/95
OtherSymposium held at the 1995 MRS Fall Meeting

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