Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence

P.J. Zaag, van der, A.R. Ball, L.F. Feiner, R.M. Wolf, P.A.A. Heijden, van der

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

127 Citations (Scopus)

Abstract

Exchange biasing has been studied for a series of [100] and [111] oriented, epitaxial Fe3O4/CoO bilayers grown by oxidic MBE. The low‐temperature exchange biasing versus CoO layer thickness is compared to theoretical models for exchange biasing. We argue that the Malozemoff random field model does not apply to this system. The exchange biasing calculated according to the Meiklejohn–Bean model, assuming nearest‐neighbor exchange coupling across a flat and magnetically uncompensated interface, differs for [100] oriented bilayers by a factor of ≂8 from the experimental value.
Original languageEnglish
Title of host publicationMMM Conference, Philadelphia, USA
Pages5103-5105
Number of pages3
DOIs
Publication statusPublished - 1996
Event40th Annual Conference on Magnetism and Magnetic Materials (MMM 1996) - Philadelphia, United States
Duration: 6 Nov 19969 Nov 1996
Conference number: 40

Publication series

NameJournal of Applied Physics
Volume79
ISSN (Print)0021-8979

Conference

Conference40th Annual Conference on Magnetism and Magnetic Materials (MMM 1996)
Abbreviated titleMMM 1996
CountryUnited States
CityPhiladelphia
Period6/11/969/11/96

Cite this

Zaag, van der, P. J., Ball, A. R., Feiner, L. F., Wolf, R. M., & Heijden, van der, P. A. A. (1996). Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence. In MMM Conference, Philadelphia, USA (pp. 5103-5105). (Journal of Applied Physics; Vol. 79). https://doi.org/10.1063/1.361315
Zaag, van der, P.J. ; Ball, A.R. ; Feiner, L.F. ; Wolf, R.M. ; Heijden, van der, P.A.A. / Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence. MMM Conference, Philadelphia, USA. 1996. pp. 5103-5105 (Journal of Applied Physics).
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abstract = "Exchange biasing has been studied for a series of [100] and [111] oriented, epitaxial Fe3O4/CoO bilayers grown by oxidic MBE. The low‐temperature exchange biasing versus CoO layer thickness is compared to theoretical models for exchange biasing. We argue that the Malozemoff random field model does not apply to this system. The exchange biasing calculated according to the Meiklejohn–Bean model, assuming nearest‐neighbor exchange coupling across a flat and magnetically uncompensated interface, differs for [100] oriented bilayers by a factor of ≂8 from the experimental value.",
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Zaag, van der, PJ, Ball, AR, Feiner, LF, Wolf, RM & Heijden, van der, PAA 1996, Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence. in MMM Conference, Philadelphia, USA. Journal of Applied Physics, vol. 79, pp. 5103-5105, 40th Annual Conference on Magnetism and Magnetic Materials (MMM 1996), Philadelphia, United States, 6/11/96. https://doi.org/10.1063/1.361315

Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence. / Zaag, van der, P.J.; Ball, A.R.; Feiner, L.F.; Wolf, R.M.; Heijden, van der, P.A.A.

MMM Conference, Philadelphia, USA. 1996. p. 5103-5105 (Journal of Applied Physics; Vol. 79).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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AU - Zaag, van der, P.J.

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AU - Wolf, R.M.

AU - Heijden, van der, P.A.A.

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AB - Exchange biasing has been studied for a series of [100] and [111] oriented, epitaxial Fe3O4/CoO bilayers grown by oxidic MBE. The low‐temperature exchange biasing versus CoO layer thickness is compared to theoretical models for exchange biasing. We argue that the Malozemoff random field model does not apply to this system. The exchange biasing calculated according to the Meiklejohn–Bean model, assuming nearest‐neighbor exchange coupling across a flat and magnetically uncompensated interface, differs for [100] oriented bilayers by a factor of ≂8 from the experimental value.

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Zaag, van der PJ, Ball AR, Feiner LF, Wolf RM, Heijden, van der PAA. Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence. In MMM Conference, Philadelphia, USA. 1996. p. 5103-5105. (Journal of Applied Physics). https://doi.org/10.1063/1.361315