Evolution of the thickness profile of UHMW-polyethylene films during sequential biaxial drawing

M.T.R. Moens, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Computational Mechanics

    Research output: ThesisPd Eng Thesis

    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Meijer, Han, Supervisor
    • Govaert, Leon E. , Supervisor
    • Peters, Gerrit W.M., Supervisor
    • Oostra, H., External supervisor, External person
    Award date1 Jan 1999
    Place of PublicationEindhoven
    Print ISBNs90-5282-939-X
    Publication statusPublished - 1999

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