Evidence for low-energy ions influencing plasma-assisted atomic layer deposition of SiO2: Impact on the growth per cycle and wet etch rate

Karsten Arts, J.H. Deijkers, Tahsin Faraz, R.L. Puurunen, W.M.M. Kessels (Corresponding author), Harm C.M. Knoops (Corresponding author)

Research output: Contribution to journal › Article › Academic › peer-review

14 Citations (Scopus)
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