Evaluation of test algorithms stress effect on SRAMs under neutron radiation

Georgios Tsiligiannis; Luigi Dilillo; Alberto Bosio; Patrick Girard; Aida Todri; Arnaud Virazel; Antoine D. Touboul; Frederic Wrobel; Frédéric Saigné

doi:10.1109/IOLTS.2012.6313853

Evaluation of test algorithms stress effect on SRAMs under neutron radiation

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

13 Citations (Scopus)

Abstract

Electronic system reliability over soft errors is very critical as the transistor size shrinks. Many recent works have defined the device error rate under radiation for SRAMs in hold mode (static) and during operation (dynamic). This paper evaluates the impact of running test algorithms on SRAMs exposed to neutron radiation in order to define their stressing factor. The results that we show are based on experiments performed at the TSL facility in Uppsala, Sweden using a Quasi-Monoenergetic neutron beam. The evaluation of the test algorithms is based on the calculated device SEU cross section.

Original language	English
Title of host publication	2012 IEEE 18th International On-Line Testing Symposium (IOLTS)
Publisher	Institute of Electrical and Electronics Engineers
Pages	121-122
Number of pages	2
ISBN (Electronic)	978-1-4673-2085-6
ISBN (Print)	978-1-4673-2082-5
DOIs	https://doi.org/10.1109/IOLTS.2012.6313853
Publication status	Published - 27 Sept 2012
Externally published	Yes
Event	18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain Duration: 27 Jun 2012 → 29 Jun 2012

Conference

Conference	18th International On-Line Testing Symposium (IOLTS 2012)
Country/Territory	Spain
City	Sitges
Period	27/06/12 → 29/06/12

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10.1109/IOLTS.2012.6313853

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Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Todri, A., Virazel, A., Touboul, A. D., Wrobel, F., & Saigné, F. (2012). Evaluation of test algorithms stress effect on SRAMs under neutron radiation. In 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) (pp. 121-122). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IOLTS.2012.6313853

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title = "Evaluation of test algorithms stress effect on SRAMs under neutron radiation",

abstract = "Electronic system reliability over soft errors is very critical as the transistor size shrinks. Many recent works have defined the device error rate under radiation for SRAMs in hold mode (static) and during operation (dynamic). This paper evaluates the impact of running test algorithms on SRAMs exposed to neutron radiation in order to define their stressing factor. The results that we show are based on experiments performed at the TSL facility in Uppsala, Sweden using a Quasi-Monoenergetic neutron beam. The evaluation of the test algorithms is based on the calculated device SEU cross section.",

author = "Georgios Tsiligiannis and Luigi Dilillo and Alberto Bosio and Patrick Girard and Aida Todri and Arnaud Virazel and Touboul, {Antoine D.} and Frederic Wrobel and Fr{\'e}d{\'e}ric Saign{\'e}",

year = "2012",

month = sep,

day = "27",

doi = "10.1109/IOLTS.2012.6313853",

language = "English",

isbn = "978-1-4673-2082-5",

pages = "121--122",

booktitle = "2012 IEEE 18th International On-Line Testing Symposium (IOLTS)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "18th International On-Line Testing Symposium (IOLTS 2012) ; Conference date: 27-06-2012 Through 29-06-2012",

}

Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Todri, A, Virazel, A, Touboul, AD, Wrobel, F & Saigné, F 2012, Evaluation of test algorithms stress effect on SRAMs under neutron radiation. in 2012 IEEE 18th International On-Line Testing Symposium (IOLTS). Institute of Electrical and Electronics Engineers, pp. 121-122, 18th International On-Line Testing Symposium (IOLTS 2012), Sitges, Spain, 27/06/12. https://doi.org/10.1109/IOLTS.2012.6313853

Evaluation of test algorithms stress effect on SRAMs under neutron radiation. / Tsiligiannis, Georgios; Dilillo, Luigi; Bosio, Alberto et al.
2012 IEEE 18th International On-Line Testing Symposium (IOLTS). Institute of Electrical and Electronics Engineers, 2012. p. 121-122.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Evaluation of test algorithms stress effect on SRAMs under neutron radiation

AU - Tsiligiannis, Georgios

AU - Dilillo, Luigi

AU - Bosio, Alberto

AU - Girard, Patrick

AU - Todri, Aida

AU - Virazel, Arnaud

AU - Touboul, Antoine D.

AU - Wrobel, Frederic

AU - Saigné, Frédéric

PY - 2012/9/27

Y1 - 2012/9/27

N2 - Electronic system reliability over soft errors is very critical as the transistor size shrinks. Many recent works have defined the device error rate under radiation for SRAMs in hold mode (static) and during operation (dynamic). This paper evaluates the impact of running test algorithms on SRAMs exposed to neutron radiation in order to define their stressing factor. The results that we show are based on experiments performed at the TSL facility in Uppsala, Sweden using a Quasi-Monoenergetic neutron beam. The evaluation of the test algorithms is based on the calculated device SEU cross section.

AB - Electronic system reliability over soft errors is very critical as the transistor size shrinks. Many recent works have defined the device error rate under radiation for SRAMs in hold mode (static) and during operation (dynamic). This paper evaluates the impact of running test algorithms on SRAMs exposed to neutron radiation in order to define their stressing factor. The results that we show are based on experiments performed at the TSL facility in Uppsala, Sweden using a Quasi-Monoenergetic neutron beam. The evaluation of the test algorithms is based on the calculated device SEU cross section.

U2 - 10.1109/IOLTS.2012.6313853

DO - 10.1109/IOLTS.2012.6313853

M3 - Conference contribution

SN - 978-1-4673-2082-5

SP - 121

EP - 122

BT - 2012 IEEE 18th International On-Line Testing Symposium (IOLTS)

PB - Institute of Electrical and Electronics Engineers

T2 - 18th International On-Line Testing Symposium (IOLTS 2012)

Y2 - 27 June 2012 through 29 June 2012

ER -

Evaluation of test algorithms stress effect on SRAMs under neutron radiation

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