Evaluation of signature-based testing of RF/analog circuits

A. Zjajo; J. Pineda de Gyvez

doi:10.1109/ETS.2005.22

Evaluation of signature-based testing of RF/analog circuits

A. Zjajo, J. Pineda de Gyvez

Electronic Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

13 Citations (Scopus)

127 Downloads (Pure)

Abstract

Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.

Original language	English
Title of host publication	Proceedings of the 10th IEEE European Test Symposium, 2005, 22-25 May 2005, Tallinn, Estonia
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	62-67
ISBN (Print)	0-7695-2341-2
DOIs	https://doi.org/10.1109/ETS.2005.22
Publication status	Published - 2005

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10.1109/ETS.2005.22

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title = "Evaluation of signature-based testing of RF/analog circuits",

abstract = "Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.",

author = "A. Zjajo and {Pineda de Gyvez}, J.",

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doi = "10.1109/ETS.2005.22",

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booktitle = "Proceedings of the 10th IEEE European Test Symposium, 2005, 22-25 May 2005, Tallinn, Estonia",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

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Evaluation of signature-based testing of RF/analog circuits. / Zjajo, A.; Pineda de Gyvez, J.
Proceedings of the 10th IEEE European Test Symposium, 2005, 22-25 May 2005, Tallinn, Estonia. Piscataway: Institute of Electrical and Electronics Engineers, 2005. p. 62-67.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Evaluation of signature-based testing of RF/analog circuits

AU - Zjajo, A.

AU - Pineda de Gyvez, J.

PY - 2005

Y1 - 2005

N2 - Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.

AB - Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.

U2 - 10.1109/ETS.2005.22

DO - 10.1109/ETS.2005.22

M3 - Conference contribution

SN - 0-7695-2341-2

SP - 62

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BT - Proceedings of the 10th IEEE European Test Symposium, 2005, 22-25 May 2005, Tallinn, Estonia

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

Evaluation of signature-based testing of RF/analog circuits

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