Enabling big data to increase output at NXP semiconductor operations

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Original language	English
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Number of pages	18
ISBN (Print)	978-90-386-4311-3
Publication status	Published - 30 May 2017

Name	eSCF operations practices : insights from science
Publisher	Technische Universiteit Eindhoven

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title = "Enabling big data to increase output at NXP semiconductor operations",

author = "V.C.S. Wiers",

editor = "{de Kok}, A.G. and R.M. Dijkman",

year = "2017",

month = may,

day = "30",

language = "English",

isbn = "978-90-386-4311-3",

series = "eSCF operations practices : insights from science",

publisher = "Technische Universiteit Eindhoven",

}

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AU - Wiers, V.C.S.

A2 - de Kok, A.G.

A2 - Dijkman, R.M.

PY - 2017/5/30

Y1 - 2017/5/30

M3 - Report

SN - 978-90-386-4311-3

T3 - eSCF operations practices : insights from science

BT - Enabling big data to increase output at NXP semiconductor operations

PB - Technische Universiteit Eindhoven

CY - Eindhoven

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