Enabling big data to increase output at NXP semiconductor operations

Research output: Book/ReportReportAcademic

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Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages18
ISBN (Print)978-90-386-4311-3
Publication statusPublished - 30 May 2017

Publication series

NameeSCF operations practices : insights from science
PublisherTechnische Universiteit Eindhoven

Cite this

Wiers, V. C. S., de Kok, A. G. (Ed.), & Dijkman, R. M. (Ed.) (2017). Enabling big data to increase output at NXP semiconductor operations. (eSCF operations practices : insights from science). Technische Universiteit Eindhoven.