Empirical Bayes approach to improved wavelet thresholding for image noise reduction

M.H. Jansen, A. Bultheel

    Research output: Book/ReportReportAcademic

    Original languageEnglish
    Place of PublicationLeuven, Belgium
    PublisherKatholieke Universiteit Leuven
    Publication statusPublished - 1999

    Publication series

    NameTechnical Report
    VolumeTW-296

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