@inproceedings{71c6ea3329f34e3e9e6ca671e75953a0,
title = "Empirical analysis of the relation between level of detail in UML models and defect density",
abstract = "This paper investigates the relation between the level of detail (LoD) in UML models and defect density of the associated implementation. We propose LoD measures that are applicable to both class- and sequence diagrams. Based on empirical data from an industrial software project we have found that classes with higher LoD, calculated using sequence diagram LoD metrics, correlates with lower defect density. Overall, this paper discusses a novel and practical approach to measure LoD in UML models and describes its application to a significant industrial case study.",
author = "A. Nugroho and B. Flaton and M.R.V. Chaudron",
year = "2008",
doi = "10.1007/978-3-540-87875-9_42",
language = "English",
isbn = "978-3-540-87874-2",
series = "Lecture Notes in Computer Science",
publisher = "Springer",
pages = "600--614",
editor = "K. Czarnecki and I. Ober and J.M. Bruel and A. Uhl and M. V{\"o}lter",
booktitle = "Model Driven Engineering Languages and Systems (11th International Conference, MoDELS 2008, Toulouse, France, September 28 - October 3, 2008, Proceedings)",
address = "Germany",
}