Empirical analysis of the relation between level of detail in UML models and defect density

A. Nugroho, B. Flaton, M.R.V. Chaudron

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Abstract

This paper investigates the relation between the level of detail (LoD) in UML models and defect density of the associated implementation. We propose LoD measures that are applicable to both class- and sequence diagrams. Based on empirical data from an industrial software project we have found that classes with higher LoD, calculated using sequence diagram LoD metrics, correlates with lower defect density. Overall, this paper discusses a novel and practical approach to measure LoD in UML models and describes its application to a significant industrial case study.
Original languageEnglish
Title of host publicationModel Driven Engineering Languages and Systems (11th International Conference, MoDELS 2008, Toulouse, France, September 28 - October 3, 2008, Proceedings)
EditorsK. Czarnecki, I. Ober, J.M. Bruel, A. Uhl, M. Völter
Place of PublicationBerlin
PublisherSpringer
Pages600-614
ISBN (Print)978-3-540-87874-2
DOIs
Publication statusPublished - 2008

Publication series

NameLecture Notes in Computer Science
Volume5301
ISSN (Print)0302-9743

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