Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

J. Geuzebroek; E.J. Marinissen; A. Majhi; A. Glowatz; F. Hapke

doi:10.1109/TEST.2007.4437649

Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

J. Geuzebroek, E.J. Marinissen, A. Majhi, A. Glowatz, F. Hapke

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

61 Citations (Scopus)

Abstract

The demand for higher quality requires more effective testing to filter out the bad devices. It is already known that multi-detection of single stuck-at faults results in more fortuitous detections of defects not behaving as stuck-at faults, which increases the test quality. Existing multi-detect tests, i.e., the well-known n-detect tests, suffer from significant test size increases. This paper shows that embedding multi-detection of faults within regular ATPG patterns results in a higher quality without a significant increase in test set size. High-volume silicon measurement results demonstrate that embedded multi-detect tests detect 2.3% to 4.7% more defective devices than conventional single-detect stuck-at tests.

Original language	English
Title of host publication	2007 IEEE International Test Conference
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Number of pages	10
ISBN (Print)	978-1-4244-1127-6
DOIs	https://doi.org/10.1109/TEST.2007.4437649
Publication status	Published - 2007
Externally published	Yes
Event	10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007) - Acropolis, Nice, France Duration: 16 Apr 2007 → 20 Apr 2007 Conference number: 10

Conference

Conference	10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007)
Abbreviated title	DATE 2007
Country/Territory	France
City	Nice
Period	16/04/07 → 20/04/07

Access to Document

10.1109/TEST.2007.4437649

Cite this

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abstract = "The demand for higher quality requires more effective testing to filter out the bad devices. It is already known that multi-detection of single stuck-at faults results in more fortuitous detections of defects not behaving as stuck-at faults, which increases the test quality. Existing multi-detect tests, i.e., the well-known n-detect tests, suffer from significant test size increases. This paper shows that embedding multi-detection of faults within regular ATPG patterns results in a higher quality without a significant increase in test set size. High-volume silicon measurement results demonstrate that embedded multi-detect tests detect 2.3% to 4.7% more defective devices than conventional single-detect stuck-at tests.",

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Geuzebroek, J, Marinissen, EJ, Majhi, A, Glowatz, A & Hapke, F 2007, Embedded multi-detect ATPG and its effect on the detection of unmodeled defects. in 2007 IEEE International Test Conference., 30.3, Institute of Electrical and Electronics Engineers, Piscataway, 10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007), Nice, France, 16/04/07. https://doi.org/10.1109/TEST.2007.4437649

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AU - Glowatz, A.

AU - Hapke, F.

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Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

Abstract

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