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Dive into the research topics of 'Ellipsometric Porosimetry for the Microstructure Characterization of Plasma-Deposited SiO2-Like Films'. Together they form a unique fingerprint.- Sort by
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M. Creatore, N.M. Terlinden, G. Aresta, M.C.M. Sanden, van de
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic