Electrorefraction in strained InGaAs/InP chopped quantum wells : significance of the interface layers

B.H.P. Dorren, A. Silov, M.R. Leijs, J.E.M. Haverkort, J.H. Wolter

Research output: Contribution to journal › Article › Academic › peer-review

8 Citations (Scopus)
137 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Electrorefraction in strained InGaAs/InP chopped quantum wells : significance of the interface layers'. Together they form a unique fingerprint.

Physics