Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection

A. Berrier; M.C. Schaafsma; J. Gómez Rivas; H. Schäfer-Eberwein; P. Haring Bolivar; L. Tripodi; M.K. Matters-Kammerer

doi:10.1109/EuMC.2015.7345915

Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection

A. Berrier
, M.C. Schaafsma
, J. Gómez Rivas
, H. Schäfer-Eberwein
, P. Haring Bolivar
, L. Tripodi
, M.K. Matters-Kammerer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

6 Downloads (Pure)

Abstract

We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner's office.

Original language	English
Title of host publication	European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	925-928
Number of pages	4
ISBN (Print)	978-2-87487-039-2
DOIs	https://doi.org/10.1109/EuMC.2015.7345915
Publication status	Published - 2 Dec 2015
Event	45th European Microwave Conference (EuMC 2015) - Paris, France Duration: 7 Sept 2015 → 10 Sept 2015 Conference number: 45

Conference

Conference	45th European Microwave Conference (EuMC 2015)
Abbreviated title	EuMC 2015
Country/Territory	France
City	Paris
Period	7/09/15 → 10/09/15
Other	Conference held as part of the 18th European Microwave Week (EuMW 2015)

Keywords

CMOS non-linear transmission line
plasmonics
sensing
Terahertz spectroscopy

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10.1109/EuMC.2015.7345915

Cite this

Berrier, A., Schaafsma, M. C., Gómez Rivas, J., Schäfer-Eberwein, H., Haring Bolivar, P., Tripodi, L., & Matters-Kammerer, M. K. (2015). Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection. In European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC (pp. 925-928). Article 7345915 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EuMC.2015.7345915

Berrier, A. ; Schaafsma, M.C. ; Gómez Rivas, J. et al. / Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection. European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC. Piscataway : Institute of Electrical and Electronics Engineers, 2015. pp. 925-928

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title = "Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection",

abstract = "We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner's office.",

keywords = "CMOS non-linear transmission line, plasmonics, sensing, Terahertz spectroscopy",

author = "A. Berrier and M.C. Schaafsma and \{G{\'o}mez Rivas\}, J. and H. Sch{\"a}fer-Eberwein and \{Haring Bolivar\}, P. and L. Tripodi and M.K. Matters-Kammerer",

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doi = "10.1109/EuMC.2015.7345915",

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publisher = "Institute of Electrical and Electronics Engineers",

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Berrier, A, Schaafsma, MC, Gómez Rivas, J, Schäfer-Eberwein, H, Haring Bolivar, P, Tripodi, L & Matters-Kammerer, MK 2015, Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection. in European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC., 7345915, Institute of Electrical and Electronics Engineers, Piscataway, pp. 925-928, 45th European Microwave Conference (EuMC 2015), Paris, France, 7/09/15. https://doi.org/10.1109/EuMC.2015.7345915

Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection. / Berrier, A.; Schaafsma, M.C.; Gómez Rivas, J. et al.
European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC. Piscataway: Institute of Electrical and Electronics Engineers, 2015. p. 925-928 7345915.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection

AU - Berrier, A.

AU - Schaafsma, M.C.

AU - Gómez Rivas, J.

AU - Schäfer-Eberwein, H.

AU - Haring Bolivar, P.

AU - Tripodi, L.

AU - Matters-Kammerer, M.K.

N1 - Conference code: 45

PY - 2015/12/2

Y1 - 2015/12/2

N2 - We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner's office.

AB - We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner's office.

KW - CMOS non-linear transmission line

KW - plasmonics

KW - sensing

KW - Terahertz spectroscopy

UR - https://www.scopus.com/pages/publications/84964334824

U2 - 10.1109/EuMC.2015.7345915

DO - 10.1109/EuMC.2015.7345915

M3 - Conference contribution

SN - 978-2-87487-039-2

SP - 925

EP - 928

BT - European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 45th European Microwave Conference (EuMC 2015)

Y2 - 7 September 2015 through 10 September 2015

ER -

Berrier A, Schaafsma MC, Gómez Rivas J, Schäfer-Eberwein H, Haring Bolivar P, Tripodi L et al. Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection. In European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC. Piscataway: Institute of Electrical and Electronics Engineers. 2015. p. 925-928. 7345915 doi: 10.1109/EuMC.2015.7345915

Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection

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Keywords

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